DocumentCode
2481601
Title
A test standard for calibrating high accurate ADC and DAC
Author
Tong Guangqui ; Zhang Xiuzeng
Author_Institution
Heping Street, Beijing, China
fYear
1996
fDate
17-21 June 1996
Firstpage
550
Lastpage
551
Abstract
In this paper, a test standard system for measuring ADC and DAC is introduced. By a computer, ADC and DAC can be measured automatically with 24 bits resolution and 1 ppm linearity. The testing speed can be up to 10 KHz.
Keywords
analogue-digital conversion; automatic test equipment; automatic test software; digital-analogue conversion; field buses; 10 kHz; 24 bit; ADC; DAC; automatic measurement; calibration; high accuracy; internal controller; measurement bus; parallel interface; test software; test standard system; testing speed; Assembly; Hardware; Linearity; Measurement standards; Read-write memory; Signal processing; Switches; Testing; Visual BASIC;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.547343
Filename
547343
Link To Document