DocumentCode
2481617
Title
Enclosure Acoustics Modeling and Control Utilizing a Passive and Active Structural Tailoring
Author
Whitmer, Christopher E. ; Kelkar, Atul G.
Author_Institution
Mech. Eng., Iowa State Univ., Ames, IA
fYear
2006
fDate
13-15 Dec. 2006
Firstpage
6684
Lastpage
6689
Abstract
The subject of this paper is the redesign a flat panel to couple less effectively to acoustic enclosures, and improve transmission loss between the enclosures. First presented is a brief background of the theory of acoustic noise in reverberant enclosures. Finite dimensional acoustic and structural models are linked producing a fully coupled linear control design model. These developments are then specifically applied to a 3D acoustic chamber consisting of two separated 4ft times 4ft times 8ft enclosures. Passive redesign of the structure for minimal coupling and several mass mimicking active noise controllers were investigated. A decentralized MIMO controller was designed and simulated to mimic the effect of additional mass. These models and designs are currently being validated on an experimental test bed. Future efforts will examine additional control design strategies including modal clustering, passification by optimal blending of sensors and actuators, and the use of locally reacting sources on the plate surface to target acoustic structure coupling directly
Keywords
MIMO systems; acoustic wave transmission; architectural acoustics; control system synthesis; decentralised control; linear systems; noise abatement; reverberation; 3D acoustic chamber; acoustic noise; acoustic structure coupling; active structural tailoring; decentralized MIMO controller; enclosure acoustic control; flat panel; linear control design; modal clustering; passive structural tailoring; reverberant enclosure; transmission loss; Acoustic noise; Acoustic sensors; Acoustic testing; Active noise reduction; Actuators; Control design; Couplings; MIMO; Propagation losses; Weight control;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2006 45th IEEE Conference on
Conference_Location
San Diego, CA
Print_ISBN
1-4244-0171-2
Type
conf
DOI
10.1109/CDC.2006.376732
Filename
4177914
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