• DocumentCode
    2482346
  • Title

    Wide dynamic range CMOS active pixel sensor using a stacked-photodiode structure

  • Author

    Jo, Sung-Hyun ; Bae, Myunghan ; Shin, Jang-Kyoo

  • Author_Institution
    Sch. of Electron. Eng., Kyungpook Nat. Univ., Daegu, South Korea
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    1378
  • Lastpage
    1381
  • Abstract
    In this paper, we propose a stacked-photodiode structure to extend the dynamic range of the CMOS active pixel sensor (APS). The proposed APS uses two photodiodes with different sensitivities and two additional MOSFETs in comparison with a conventional 3-transistor APS. Although the size of pixel is slightly larger than that of conventional 3-transistor APS, extension of the dynamic range is much easier than conventional methods by adjusting the reference voltage. The dynamic range of the proposed APS was greater than 103 dB. The designed circuit has been fabricated by using 0.35 μm 2-poly 4-metal standard CMOS technology and its characteristics have been evaluated.
  • Keywords
    CMOS image sensors; MOSFET; photodiodes; 2-poly 4-metal standard CMOS technology; conventional 3-transistor APS; size 0.34 mum; stacked-photodiode structure; two additional MOSFET; wide dynamic range CMOS active pixel sensor; CMOS image sensors; CMOS integrated circuits; CMOS technology; Dynamic range; Lighting; Photodiodes; Sensitivity; dyanmic range; feedback structure; stacked-photodiode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
  • Conference_Location
    Graz
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4577-1773-4
  • Type

    conf

  • DOI
    10.1109/I2MTC.2012.6229496
  • Filename
    6229496