DocumentCode
2482346
Title
Wide dynamic range CMOS active pixel sensor using a stacked-photodiode structure
Author
Jo, Sung-Hyun ; Bae, Myunghan ; Shin, Jang-Kyoo
Author_Institution
Sch. of Electron. Eng., Kyungpook Nat. Univ., Daegu, South Korea
fYear
2012
fDate
13-16 May 2012
Firstpage
1378
Lastpage
1381
Abstract
In this paper, we propose a stacked-photodiode structure to extend the dynamic range of the CMOS active pixel sensor (APS). The proposed APS uses two photodiodes with different sensitivities and two additional MOSFETs in comparison with a conventional 3-transistor APS. Although the size of pixel is slightly larger than that of conventional 3-transistor APS, extension of the dynamic range is much easier than conventional methods by adjusting the reference voltage. The dynamic range of the proposed APS was greater than 103 dB. The designed circuit has been fabricated by using 0.35 μm 2-poly 4-metal standard CMOS technology and its characteristics have been evaluated.
Keywords
CMOS image sensors; MOSFET; photodiodes; 2-poly 4-metal standard CMOS technology; conventional 3-transistor APS; size 0.34 mum; stacked-photodiode structure; two additional MOSFET; wide dynamic range CMOS active pixel sensor; CMOS image sensors; CMOS integrated circuits; CMOS technology; Dynamic range; Lighting; Photodiodes; Sensitivity; dyanmic range; feedback structure; stacked-photodiode;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location
Graz
ISSN
1091-5281
Print_ISBN
978-1-4577-1773-4
Type
conf
DOI
10.1109/I2MTC.2012.6229496
Filename
6229496
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