• DocumentCode
    2482630
  • Title

    Evaluation of a twist-on connector for aluminum wire

  • Author

    Aronstein, Jesse

  • Author_Institution
    Poughkeepsie, NY, USA
  • fYear
    1997
  • fDate
    20-22 Oct. 1997
  • Firstpage
    46
  • Lastpage
    56
  • Abstract
    A new type of twist-on splicing connector for use with aluminum and copper wire combinations is tested to determine initial resistance, performance in a zero-current environmental test, performance in a heat-cycle test, and portion of current carried by the connector´s steel spring. The splices tested consist of two aluminum wires and one copper wire. The aluminum wire samples used for the test are of the types actually installed in aluminum-wired homes. Initial resistance is found to be relatively high, and there is a significant sample-to-sample variation. This reflects failure to consistently establish low-resistance wire-to-wire contact through the insulating oxide film on the wire. Results of the environmental and heat-cycle tests show deterioration of a significant portion of the samples. The splices made with this connector are also found to be sensitive to mechanical disturbance, such as applied in normal installation when the completed splice is pushed back into the junction box. Based on the test results, it is concluded that this connector has not overcome the fundamental deficiency of twist-on connectors for use with aluminum wire, and is not considered to be suitable for permanent splices in residential aluminum wire applications.
  • Keywords
    aluminium; electric connectors; electric resistance; environmental testing; failure analysis; reliability; Al; Al wire; Cu; Cu wire; heat-cycle test; initial resistance; mechanical disturbance; splicing connector; steel spring; twist-on connector; zero-current environmental test; Aluminum; Connectors; Contacts; Copper; Resistance heating; Splicing; Springs; Steel; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1997., Proceedings of the Forty-Third IEEE Holm Conference on
  • Conference_Location
    Philadelphia, PA, USA
  • Print_ISBN
    0-7803-3968-1
  • Type

    conf

  • DOI
    10.1109/HOLM.1997.637874
  • Filename
    637874