• DocumentCode
    2482821
  • Title

    Using transformer differential relay IOP characteristics to measure near-trip conditions

  • Author

    Criss, John ; Lawhead, Larry

  • Author_Institution
    Basler Electr. Co., Highland, IL, USA
  • fYear
    1996
  • fDate
    6-9 May 1996
  • Firstpage
    103
  • Lastpage
    108
  • Abstract
    When a transformer differential relay operates with no obvious transformer fault, system operators have a serious decision to make: is there a transformer fault, or did the relay trip incorrectly? Testing the transformer requires significant time, with associated costs. However, re-energizing a faulted transformer can lead to catastrophic failure. This scenario of a questionable transformer trip occurs too often, especially during the commissioning of new transformers and/or differential relays. Usually a differential relay false trip is caused by either incorrect settings or incorrect current transformer (CT) secondary lead connections. These conditions can cause false trips for external faults, or simply transformer loading. Some indication is needed that the relay is not operating as desired, before an incorrect trip happens. A potential problem can be discovered by monitoring the operating condition of the differential relay. An indicator can serve as a warning if the settings or connections are not correct
  • Keywords
    electrical faults; power transformer protection; relay protection; external faults; faulted transformer re-energisation; incorrect current transformer connections; incorrect settings; near-trip conditions measurement; relay false trip; relay tripping; secondary lead connections; transformer differential relay; Costs; Current transformers; Low voltage; Power system faults; Power system relaying; Power transformers; Protection; Protective relaying; Relays; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial and Commercial Power Systems Technical Conference, 1996. Conference Record, Papers Presented at the 1996 Annual Meeting., IEEE 1996
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    0-7803-3263-6
  • Type

    conf

  • DOI
    10.1109/ICPS.1996.533943
  • Filename
    533943