DocumentCode
2482834
Title
P6H-1 Electrochemical Etching of Quartz
Author
Rodrigue, Eric ; Kaajakari, Ville
Author_Institution
Louisiana Tech Univ., Ruston
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
2586
Lastpage
2589
Abstract
We present the first results on the electrochemical etching of crystalline quartz. Used for bulk micromachining of silicon, electrochemical etching has not been previously explored as a method for processing quartz because of its insulating nature. By injecting energetic charge carriers into the quartz it can be made temporarily conductive, allowing current to be passed through in magnitudes which will affect the chemical etch rate. This was experimentally verified by etching samples of AT-cut quartz while bombarding the sample with electrons. Etch depths were measured and plotted as a function of current density, showing a variation of +/-3X the control etch rate. The ability to increase and decrease the etch rate can be used to define novel quartz microstructures.
Keywords
acoustic resonators; crystal resonators; electrochemical machining; etching; piezoelectric materials; quartz; ultrasonic devices; AT cut quartz; SiO2; chemical etch rate; current density; energetic charge carrier injection; etch depth; quartz electrochemical etching; quartz insulator; temporarily conductive quartz; Charge carriers; Chemicals; Crystallization; Current measurement; Density measurement; Electrons; Etching; Insulation; Micromachining; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2007. IEEE
Conference_Location
New York, NY
ISSN
1051-0117
Print_ISBN
978-1-4244-1384-3
Electronic_ISBN
1051-0117
Type
conf
DOI
10.1109/ULTSYM.2007.651
Filename
4410224
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