• DocumentCode
    2482834
  • Title

    P6H-1 Electrochemical Etching of Quartz

  • Author

    Rodrigue, Eric ; Kaajakari, Ville

  • Author_Institution
    Louisiana Tech Univ., Ruston
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    2586
  • Lastpage
    2589
  • Abstract
    We present the first results on the electrochemical etching of crystalline quartz. Used for bulk micromachining of silicon, electrochemical etching has not been previously explored as a method for processing quartz because of its insulating nature. By injecting energetic charge carriers into the quartz it can be made temporarily conductive, allowing current to be passed through in magnitudes which will affect the chemical etch rate. This was experimentally verified by etching samples of AT-cut quartz while bombarding the sample with electrons. Etch depths were measured and plotted as a function of current density, showing a variation of +/-3X the control etch rate. The ability to increase and decrease the etch rate can be used to define novel quartz microstructures.
  • Keywords
    acoustic resonators; crystal resonators; electrochemical machining; etching; piezoelectric materials; quartz; ultrasonic devices; AT cut quartz; SiO2; chemical etch rate; current density; energetic charge carrier injection; etch depth; quartz electrochemical etching; quartz insulator; temporarily conductive quartz; Charge carriers; Chemicals; Crystallization; Current measurement; Density measurement; Electrons; Etching; Insulation; Micromachining; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2007. IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1051-0117
  • Print_ISBN
    978-1-4244-1384-3
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2007.651
  • Filename
    4410224