• DocumentCode
    2482881
  • Title

    Temperature measurement of low-current discharges based on N2 (2+) molecular emission spectra

  • Author

    Xiao, A. ; Rowland, S.M. ; Whitehead, J.C. ; Tu, X.

  • Author_Institution
    Sch. of Electron. & Electr. Eng., Univ. of Manchester, Manchester, UK
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    191
  • Lastpage
    194
  • Abstract
    A series of experiments has been carried out to determine the gas temperature of low current (<; 5 mA) discharges in ambient conditions. The measurement is based on optical emission spectroscopy (OES) analysis using N2 (2+) molecular emission spectra of the air discharge. Temperatures of discharges of different current levels with various arc lengths have been measured and analysis has been carried out to determine the relationships between discharge temperatures, discharge currents and arc lengths. Between lengths of 2 and 6 mm, and currents of 3 and 4.5 mA, predictable temperature variations were found between 1200 and 1800 k.
  • Keywords
    arcs (electric); plasma diagnostics; plasma temperature; plasma transport processes; temperature measurement; N2 (2+) molecular emission spectra; OES analysis; air discharge; ambient conditions; arc lengths; current levels; discharge currents; discharge temperatures; gas temperature; low-current discharges; optical emission spectroscopy analysis; temperature measurement; Current measurement; Discharges (electric); Fault diagnosis; Plasma temperature; Resistors; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
  • Conference_Location
    Montreal, QC
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4673-1253-0
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2012.6378753
  • Filename
    6378753