DocumentCode
2483432
Title
Modelling of electro-opto-thermal interactions in quantum well lasers
Author
Bewtra, N. ; Tan, G.L. ; Neumann, R. ; Chatenoud, F. ; Xu, J.M.
Author_Institution
Dept. of Electr. Eng., Toronto Univ., Ont., Canada
fYear
1993
fDate
15-18 Nov 1993
Firstpage
631
Lastpage
632
Abstract
Summary form only given. As the size of OEICs and the number of components increase, the issue of thermal interaction becomes increasingly important. To analyze the thermal interactions between multiple devices and its effect on laser performance, we have developed a lumped element circuit model which includes the electrical, optical, and thermal interaction effects. This model supplements the two dimensional finite-element non-isothermal simulations which provide a detailed insight into the internal thermal effects for individual structures, but offers a more practical method for modelling multiple devices in integrated optoelectronic circuits. This new lumped element model of laser diodes is directly derived from the carrier and the photon rate equations and the thermal conduction equation
Keywords
electro-optical effects; finite element analysis; integrated optoelectronics; laser theory; photothermal effects; quantum well lasers; semiconductor device models; simulation; OEICs; carrier rate equations; electro-opto-thermal interaction modelling; integrated optoelectronic circuits; internal thermal effects; laser diodes; laser performance; lumped element circuit model; lumped element model; multiple device modelling; multiple devices; photon rate equations; quantum well lasers; thermal conduction equation; thermal interaction; thermal interaction effects; two dimensional finite-element non-isothermal simulations; Circuit simulation; Diode lasers; Equations; Finite element methods; Integrated optoelectronics; Laser modes; Optical devices; Performance analysis; Quantum well lasers; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location
San Jose, CA
Print_ISBN
0-7803-1263-5
Type
conf
DOI
10.1109/LEOS.1993.379347
Filename
379347
Link To Document