• DocumentCode
    2483859
  • Title

    Some hints at the combined effects of load cycles and electrothermal stress on HVDC extruded cable reliability in the long term prequalification test

  • Author

    Marzinotto, M. ; Mazzanti, G.

  • Author_Institution
    TERNA, Rome, Italy
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    391
  • Lastpage
    394
  • Abstract
    As confirmed by the new CIGRE Technical Brochure (TB) 496, the prequalification (PQ) test of HVDC extruded cable systems is based on a sequence of 360 “24 hours” load cycles, whose duration is based on a voltage-time characteristic with exponent n=10 and on a design life of 40 years at constant rated voltage, without any explicit consideration of thermal and syner-gistic electro-thermal aging effects related to load cycles. Here a method is proposed for estimating failure time percentiles that accounts for the time-varying temperature during the PQ test load cycles via a “two-level of approximation” approach relying on: 1) Miner´s law of cumulated aging; 2) an improved voltage-time characteristic that includes the electrothermal stress; 3) a probabilistic framework based on the Weibull hypothesis. The application to a typical HVDC cable design - with consideration of possible field profile inversion effects due to the load - is novel. In this way, a more accurate correlation between cable insulation reliability at 40 years design conditions and that after 360 “24 hours” load cycles according to CIGRE TBs 219 and 496 is provided, thereby taking into account the peculiar electrothermal endurance features of a given HVDC extruded cable design.
  • Keywords
    Weibull distribution; power cable insulation; power cable testing; reliability; CIGRE technical brochure; HVDC cable design; HVDC extruded cable reliability; Miner law; PQ test load cycles; Weibull hypothesis; cable insulation reliability; electrothermal stress; high voltage direct current; load cycles stress; long term prequalification test; synergistic electrothermal aging effects; thermal aging effects; time-varying temperature; voltage-time characteristic; Approximation methods; Cable insulation; Conductors; HVDC transmission; Power cables; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
  • Conference_Location
    Montreal, QC
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4673-1253-0
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2012.6378802
  • Filename
    6378802