• DocumentCode
    2484682
  • Title

    Mining Frequent Patterns from Software Defect Repositories for Black-Box Testing

  • Author

    Li, Ning ; Li, Zhanhuai ; Zhang, Lijun

  • Author_Institution
    Sch. of Comput. Sci. & Technol., Northwestern Polytech. Univ., Xi´´an, China
  • fYear
    2010
  • fDate
    22-23 May 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Software defects are usually detected by inspection, black-box testing or white-box testing. Current software defect mining work focuses on mining frequent patterns without distinguishing these different kinds of defects, and mining with respect to defect type can only give limited guidance on software development due to overly broad classification of defect type. In this paper, we present four kinds of frequent patterns from defects detected by black-box testing (called black-box defect) based on a kind of detailed classification named ODC-BD (Orthogonal Defect Classification for Blackbox Defect). The frequent patterns include the top 10 conditions (data or operation) which most easily result in defects or severe defects, the top 10 defect phenomena which most frequently occur and have a great impact on users, association rules between function modules and defect types. We aim to help project managers, black-box testers and developers improve the efficiency of software defect detection and analysis using these frequent patterns. Our study is based on 5023 defect reports from 56 large industrial projects and 2 open source projects.
  • Keywords
    data mining; pattern classification; program testing; project management; ODC-BD classification; association rules; black-box testing; frequent pattern mining; orthogonal defect classification for black-box defect; project managers; software defect detection; software defect repositories; software development; white-box testing; Association rules; Data mining; Inspection; Itemsets; Open source software; Pattern analysis; Programming; Software development management; Software quality; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems and Applications (ISA), 2010 2nd International Workshop on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5872-1
  • Electronic_ISBN
    978-1-4244-5874-5
  • Type

    conf

  • DOI
    10.1109/IWISA.2010.5473578
  • Filename
    5473578