• DocumentCode
    2484683
  • Title

    Vacuum ultraviolet laser ablation of insulators and III-V semiconductors

  • Author

    Herman, Peter R. ; Beckley, Keith ; Moore, J. David ; Potyrailo, Radislav A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
  • fYear
    1993
  • fDate
    15-18 Nov 1993
  • Firstpage
    764
  • Lastpage
    765
  • Abstract
    Current excimer-laser processing techniques can be extended to a broader and more diverse range of materials by moving to the vacuum ultraviolet (VUV; 100-200 nm) spectral region. Most materials are highly opaque in the VUV and the harder photon energy readily breaks chemical bonds, minimizing thermal loading at target surfaces. Further, the short-wavelength radiation affords patterning of sub quarter-micron feature sizes. An experimental survey has been undertaken to evaluate laser etch rates and surface quality produced on several polymer, glass, and semiconductor materials by both ArF and F2 excimer lasers, with the hope of defining new processing applications. A summary of this investigation is presented in this paper
  • Keywords
    III-V semiconductors; insulators; laser ablation; laser beam etching; 100 to 200 nm; ArF; ArF laser; F2; F2 excimer lasers; III-V semiconductors; chemical bonds; excimer-laser processing techniques; insulators; laser etch rates; processing applications; short-wavelength radiation; sub quarter-micron feature sizes; surface quality; thermal loading; vacuum ultraviolet laser ablation; vacuum ultraviolet spectral region; Chemical lasers; Etching; III-V semiconductor materials; Insulation; Laser ablation; Optical materials; Semiconductor lasers; Surface emitting lasers; Thermal loading; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-1263-5
  • Type

    conf

  • DOI
    10.1109/LEOS.1993.379416
  • Filename
    379416