• DocumentCode
    2484843
  • Title

    Modeling eddy current analysis data to determine depth of weld penetration

  • Author

    Hench, Karen ; Christensen, Wynn ; Gallant, Danny ; Hinde, Ralph ; Lopez, Aaron ; Martin, Charles ; Phillips, Thomas

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • Volume
    13
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    77
  • Lastpage
    82
  • Abstract
    The Applied Engineering Technology Group in the Engineering Sciences and Applications Division at Los Alamos National Laboratory is currently providing the design, engineering, assembly, and testing of an eddy current instrument for weld inspection. This instrument is designed to provide an in situ weld depth measurement of nuclear weapons primary components during fabrication. The goal of this effort is to improve the accuracy and reliability of the measurement of the weld joint depth and provide a mechanism for inspection without removing the part from the fixture. This feature is essential to accommodate the re-welding process if the inspection fails. The production system consists of a commercially available eddy current instrument and eddy current probe connected to a portable PC. The objective of the system software is acquire and analyze voltage and phase angle data to produce a near-real time estimate of weld depth. The data obtained from the instrument are perfectly suited for analysis by a neural network technique. This paper compares the effectiveness of a neural network application with traditional mathematical models for the analysis of weld depth information.
  • Keywords
    eddy current testing; neural nets; parameter estimation; welding; eddy current inspection; in situ weld depth measurement; inspection; neural networks; nuclear weapons primary components; reliability; weld penetration; Assembly; Data analysis; Design engineering; Eddy currents; Inspection; Instruments; Laboratories; Neural networks; Reliability engineering; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Congress, 2002 Proceedings of the 5th Biannual World
  • Print_ISBN
    1-889335-18-5
  • Type

    conf

  • DOI
    10.1109/WAC.2002.1049524
  • Filename
    1049524