DocumentCode
2487863
Title
Inverse Problem Solution for Multilayered Waveguide and Coaxial Structures
Author
Davidovich, M.
Author_Institution
Phys. Dept., Saratov State Univ.
fYear
0
fDate
0-0 0
Firstpage
135
Lastpage
137
Abstract
The results of full-wave analysis of open and shielded rectangular waveguide and coaxial probes for multilayered substrate structures and its inverse problem solutions for measurement of substrate parameters have been obtained and presented. They have been used for control, test and measurement of substrate parameters, including the implementation of noninvasive methods
Keywords
coaxial waveguides; inverse problems; multilayers; probes; rectangular waveguides; coaxial probes; coaxial structures; inverse problem solution; multilayered substrate structures; multilayered waveguide; open rectangular waveguide; shielded rectangular waveguide; substrate parameters measurement; Coaxial components; Dielectric measurements; Dielectric substrates; Inverse problems; Kernel; Minimization methods; Neurons; Permittivity measurement; Probes; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Mathematical Methods in Electromagnetic Theory, 2006 International Conference on
Conference_Location
Kharkiv
Print_ISBN
1-4244-0490-8
Type
conf
DOI
10.1109/MMET.2006.1689724
Filename
1689724
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