A moment method for statistical analysis of high speed VLSI interconnects

Author

Li, L.L. ; Zhang, Q.J. ; Nakhla, M.

Author_Institution

Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada

fYear

1994

fDate

1-4 May 1994

Firstpage

305

Lastpage

308

Abstract

Statistical analysis of VLSI interconnects is important in manufacturability-driven design of printed circuit boards (PCB) and multichip modules (MCM). Conventional Monte-Carlo method for such an analysis requires highly repetitive circuit simulations and is computationally intensive. This paper presents an alternative approach for statistical analysis. An analytical and explicit relationship between the statistics of the circuit output and that of circuit parameters is derived. It is based on statistical moment theory and does not require Monte-Carlo analysis. The approach is suitable for fast estimation of network statistical performances and is confirmed by examples for VLSI interconnect delay and ground noise analysis

Keywords

VLSI; circuit CAD; delays; integrated circuit interconnections; method of moments; multichip modules; network parameters; printed circuit design; statistical analysis; VLSI interconnect delay; circuit parameters; ground noise analysis; high speed VLSI interconnects; manufacturability-driven design; moment method; multichip modules; network statistical performances; printed circuit boards; statistical analysis; Circuit analysis computing; Circuit simulation; Delay estimation; Integrated circuit interconnections; Manufacturing; Moment methods; Multichip modules; Printed circuits; Statistical analysis; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994

Conference_Location

San Diego, CA

Print_ISBN

0-7803-1886-2

Type

conf

DOI

10.1109/CICC.1994.379713

Filename

379713