• DocumentCode
    249032
  • Title

    Demon registration for 3D images obtained by serial block face scanning electron microscopy

  • Author

    Thierry, Raphael ; Kirschmann, Moritz ; Hummel, Eric ; Hawes, Chris ; Genoud, Christel

  • Author_Institution
    Facility for Adv. Microscopy & Imaging, Friedrich Miescher Inst. for Biomed. Res., Basel, Switzerland
  • fYear
    2014
  • fDate
    27-30 Oct. 2014
  • Firstpage
    3587
  • Lastpage
    3591
  • Abstract
    In the last decade “Demon”-based matching algorithms have largely demonstrated their efficiency in non-rigid registration of clinical and biomedical images. This paper present an experimental study of a symmetrized variant of Thirion´s demons algorithm applied to the realignment of 3D images obtained by serial block face scanning electron microscopy (SBFSEM). Because demons are sensible to local intensity difference, it is necessary to ensure that both images have matching intensity distributions. We propose to perform the demon registration on an image intensity transformation associating total-variation denoising and modified contrast-limited adaptive histogram equalization. We compare the performance of the presented method with a B-spline based free form deformation method on a SBFSEM stack. This preliminary study shows that the demon registration applied to the proposed image intensity transformation is a fast and robust algorithm. Besides it always exhibit a better compromise in term registration accuracy and smoothness of the transformation field than the B-spline method.
  • Keywords
    image denoising; image matching; image registration; scanning electron microscopy; splines (mathematics); 3D image registration; B-spline method; SBFSEM; Thirion demon algorithm; contrast-limited adaptive histogram equalization; demon based matching algorithm; serial block face scanning electron microscopy; total-variation denoising; Algorithm design and analysis; Biomedical imaging; Histograms; Image registration; Microscopy; Splines (mathematics); Three-dimensional displays; B-spline; Non-rigid; SBFSEM; demon; registration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2014 IEEE International Conference on
  • Conference_Location
    Paris
  • Type

    conf

  • DOI
    10.1109/ICIP.2014.7025728
  • Filename
    7025728