• DocumentCode
    2491424
  • Title

    Evaluation of 5500 V-class SI-thyristor as pulsed power switching device utilizing a low inductance testing circuit

  • Author

    Ibuka, Shinji ; Yamamoto, Akira ; Hironaka, Yoji ; Osada, Toshihiro ; Yasuoka, Koichi ; Ishii, Shozo ; Shimizu, Naohiro

  • Author_Institution
    Tokyo Inst. of Technol., Japan
  • fYear
    1998
  • fDate
    22-25 Jun 1998
  • Firstpage
    106
  • Lastpage
    109
  • Abstract
    Characterization of 5500 V-class reverse conducting SI-thyristors as a pulsed power switching device was examined utilizing a low inductance testing circuit. The testing circuit consisted of nineteen doorknob type ceramic capacitors with the total capacitance of 38 nF, and had a residual inductance of less than 13 nH. The SI-thyristor, tested in this report, was specially designed for pulsed power applications. When the anode voltage of 5 kV was applied, a discharge current rose up to 4.2 kA with dl/dt of 6.8×1010 A/s, and the anode voltage fall time reached 62 ns. The comparison with conventionally designed SI-thyristors indicated the effectiveness of the new design
  • Keywords
    anodes; pulsed power switches; semiconductor device testing; switchgear testing; thyristors; 38 nF; 4.2 kA; 5 kV; 5500 V; 62 ns; SI-thyristor; anode voltage; discharge current; doorknob-type ceramic capacitors; low-inductance testing circuit; performance testing; pulsed power switching device; residual inductance; reverse conducting static induction thyristors; voltage fall time; Anodes; Capacitors; Ceramics; Circuit testing; Inductance measurement; Power semiconductor switches; Pulse circuits; Switching circuits; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator Symposium, 1998. Conference Record of the 1998 Twenty-Third International
  • Conference_Location
    Rancho Mirage, CA
  • ISSN
    1076-8467
  • Print_ISBN
    0-7803-4244-5
  • Type

    conf

  • DOI
    10.1109/MODSYM.1998.741204
  • Filename
    741204