• DocumentCode
    2493518
  • Title

    Linearity measurements of Si/SiGe Heterojunction Bipolar Transistor using a Large Signal Network Analyzer with an harmonic Load-Pull setup

  • Author

    Blanchet, F. ; Pache, D. ; Giry, A. ; El Yaagoubi, M. ; Barataud, D. ; Nebus, J.M.

  • Author_Institution
    Central CAD, STMicroelectron.
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    477
  • Lastpage
    480
  • Abstract
    This paper presents original multi-harmonic modulated load-pull measurements on a Si/SiGe HBT of STMicroelectronics technology. The original aspect is that the linearity, power and efficiency measurements are realized on an active load-pull test-bench associated with a large signal network analyzer. The aim of the measurements is to optimize and characterize the HBT excited by a CW and a two-tone signal. The comparison with the simulation lets to validate the models in large-signal
  • Keywords
    Ge-Si alloys; heterojunction bipolar transistors; network analysers; semiconductor device measurement; Si-SiGe; harmonic load pull setup; heterojunction bipolar transistor; large signal network analyzer; linearity measurements; load pull measurements; Frequency; Germanium silicon alloys; Harmonic analysis; Heterojunction bipolar transistors; Linearity; Power measurement; Power transistors; Signal analysis; Silicon germanium; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research in Microelectronics and Electronics 2006, Ph. D.
  • Conference_Location
    Otranto
  • Print_ISBN
    1-4244-0157-7
  • Type

    conf

  • DOI
    10.1109/RME.2006.1689997
  • Filename
    1689997