• DocumentCode
    2496184
  • Title

    Experimental verification and analysis for noise isolation of analog and digital chip-package-PCB hierarchical power distribution network

  • Author

    Park, Hyunjeong ; Shim, Jongjoo ; Shim, Yujeong ; Yoo, Jeongsik ; Kim, Joungho

  • Author_Institution
    Sch. of EECS, Terahertz Interconnection & Package Lab., Daejeon
  • fYear
    2008
  • fDate
    1-2 Dec. 2008
  • Firstpage
    73
  • Lastpage
    76
  • Abstract
    This paper presents and verifies a co-modeling and investigation approach of noise isolation analysis in hierarchical power distribution network (PDN) for low-noise 3D system-in-package (SiP) design. It is based on a hierarchical modeling to combine the lumped circuit models at both on-chip level PDN and off-chip level PDN. The proposed hierarchical PDN model was successfully validated with good correlations and subsequent analysis to a series of Z21 PDN impedance measurements with a frequency range from 1 MHz to 3 GHz. Using the proposed model, we can analyze and estimate the performance of the chip-package-PCB hierarchical PDN as well as can predict the effect of high frequency electromagnetic interactions between the on-chip level PDN and the off-chip level PDN.
  • Keywords
    analogue integrated circuits; digital integrated circuits; distribution networks; electric impedance; integrated circuit noise; printed circuits; system-in-package; analog chip-package-PCB; digital chip-package-PCB; electromagnetic interactions; frequency 1 MHz to 3 GHz; hierarchical modeling; hierarchical power distribution network; impedance measurements; low-noise 3D system-in-package design; lumped circuit models; noise isolation analysis; off-chip level; on-chip level; Capacitors; Frequency estimation; Impedance measurement; Noise level; Packaging; Power system modeling; Power systems; Radio frequency; Semiconductor device measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Packaging Workshop of Japan, 2008. VPWJ 2008. IEEE 9th
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-3498-5
  • Type

    conf

  • DOI
    10.1109/VPWJ.2008.4762211
  • Filename
    4762211