• DocumentCode
    2496320
  • Title

    Characterization of entropy measures against data loss: Application to EEG records

  • Author

    Roldán, Eva M Cirugeda ; Picó, Antonio Molina ; Frau, David Cuesta ; Martínez, Pau Miró ; Crespo, Sandra Oltra

  • Author_Institution
    Comput. Sci. Dept., Politechnic Univ. of Valencia, Valencia, Spain
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    6110
  • Lastpage
    6113
  • Abstract
    This study is aimed at characterizing three signal entropy measures, Approximate Entropy (ApEn), Sample Entropy (SampEn) and Multiscale Entropy (MSE) over real EEG signals when a number of samples are randomly lost due to, for example, wireless data transmission. The experimental EEG database comprises two main signal groups: control EEGs and epileptic EEGs. Results show that both SampEn and ApEn enable a clear distinction between control and epileptic signals, but SampEn shows a more robust performance over a wide range of sample loss ratios. MSE exhibits a poor behavior for ratios over a 40% of sample loss. The EEG non-stationary and random trends are kept even when a great number of samples are discarded. This behavior is similar for all the records within the same group.
  • Keywords
    electroencephalography; entropy; medical information systems; medical signal processing; ApEn; EEG records; SampEn; approximate entropy; control EEG; data loss; entropy measures; epileptic EEG; multiscale entropy; sample entropy; Complexity theory; Electroencephalography; Entropy; Loss measurement; Physiology; Robustness; Algorithms; Artifacts; Electroencephalography; Entropy; Humans; Information Storage and Retrieval; Reproducibility of Results; Seizures; Sensitivity and Specificity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6091509
  • Filename
    6091509