• DocumentCode
    2498702
  • Title

    Continued study of the photo-injection annealing of thermally diffused InP solar cells

  • Author

    Walters, R.J. ; Shaw, G.J. ; Summers, G.P. ; Messenger, S.R.

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    605
  • Lastpage
    606
  • Abstract
    The authors present more results on the photo-injection annealing of irradiated diffused junction cells. Dark IV measurements were incorporated into the experiments, and the changes in the diffusion and recombination currents in the cell junction due to the irradiation and annealing were measured along with the corresponding changes in the illuminated IV curves and deep level transient spectra. Also, the results of thermal annealing in the dark are included to further investigate the annealing of Voc and the H5 defect. The effect of different base dopant concentrations on the annealing of H5 is presented as well. These additional data allow for a more detailed description of the annealing of these cells. The results are a more complete model of the mechanism of the radiation response of the diffused junction solar cells
  • Keywords
    III-V semiconductors; annealing; deep level transient spectroscopy; indium compounds; semiconductor doping; solar cells; H5 defect; annealing; base dopant concentrations; cell junction; dark I-V measurements; deep level transient spectra; diffusion currents; illuminated IV curves; irradiated diffused junction cells; irradiation; photo-injection annealing; radiation response; recombination currents; thermal annealing; thermally diffused InP solar cells; Annealing; Displays; Indium phosphide; Laboratories; Lighting; MOCVD; Photovoltaic cells; Temperature; Thermal degradation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-0993-6
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1993.380623
  • Filename
    380623