• DocumentCode
    2498800
  • Title

    Heterojunction tunnel structures as devices

  • Author

    Kelly, M.J.

  • Author_Institution
    Surrey Res. Centre for Ion Beam Appl., Surrey Univ., Guildford, UK
  • fYear
    1997
  • fDate
    24-25 Nov 1997
  • Firstpage
    67
  • Lastpage
    69
  • Abstract
    Semiconductor multilayer structures which contain ultra-thin tunnel barriers have been used to produce a wide variety of prototype devices with very attractive figures of merit. Some of the remaining problems that have prevented commercialisation are discussed. These problems also challenge mainstream silicon microelectronics, and some further novel structures are described that might allow a degree of integration perpendicular to the wafer surface. In particular it is possible to ion implant through tunnel structures to modify the properties of deeper layers, and yet restore the pristine electronic properties by annealing. Tunnelling must be tamed if the momentum of the microelectronic revolution is to be maintained for more than another 10 years
  • Keywords
    annealing; ion implantation; microwave detectors; microwave diodes; microwave transistors; tunnel diodes; tunnel transistors; annealing; double barrier diodes; figures of merit; heterojunction tunnel structures; ion implant; microwave tunnel detector; perpendicular integration; semiconductor multilayer structures; ultra-thin tunnel barriers; vertical integration; Detectors; Heterojunctions; Manufacturing; Microelectronics; Nonhomogeneous media; Prototypes; Schottky diodes; Secondary generated hot electron injection; Silicon; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Electron Devices for Microwave and Optoelectronic Applications, 1997. EDMO. 1997 Workshop on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-4135-X
  • Type

    conf

  • DOI
    10.1109/EDMO.1997.668520
  • Filename
    668520