DocumentCode
2498800
Title
Heterojunction tunnel structures as devices
Author
Kelly, M.J.
Author_Institution
Surrey Res. Centre for Ion Beam Appl., Surrey Univ., Guildford, UK
fYear
1997
fDate
24-25 Nov 1997
Firstpage
67
Lastpage
69
Abstract
Semiconductor multilayer structures which contain ultra-thin tunnel barriers have been used to produce a wide variety of prototype devices with very attractive figures of merit. Some of the remaining problems that have prevented commercialisation are discussed. These problems also challenge mainstream silicon microelectronics, and some further novel structures are described that might allow a degree of integration perpendicular to the wafer surface. In particular it is possible to ion implant through tunnel structures to modify the properties of deeper layers, and yet restore the pristine electronic properties by annealing. Tunnelling must be tamed if the momentum of the microelectronic revolution is to be maintained for more than another 10 years
Keywords
annealing; ion implantation; microwave detectors; microwave diodes; microwave transistors; tunnel diodes; tunnel transistors; annealing; double barrier diodes; figures of merit; heterojunction tunnel structures; ion implant; microwave tunnel detector; perpendicular integration; semiconductor multilayer structures; ultra-thin tunnel barriers; vertical integration; Detectors; Heterojunctions; Manufacturing; Microelectronics; Nonhomogeneous media; Prototypes; Schottky diodes; Secondary generated hot electron injection; Silicon; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
High Performance Electron Devices for Microwave and Optoelectronic Applications, 1997. EDMO. 1997 Workshop on
Conference_Location
London
Print_ISBN
0-7803-4135-X
Type
conf
DOI
10.1109/EDMO.1997.668520
Filename
668520
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