• DocumentCode
    2502445
  • Title

    Shielding effectiveness estimation of enclosures with apertures

  • Author

    Belokour, I. ; LoVetri, J. ; Kashyap, S.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Western Ontario, London, Ont., Canada
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    855
  • Abstract
    A curve fitting technique has been used to develop a “phenomenological” model based on numerically collected data for the coupling of electromagnetic energy through apertures into enclosures. It has been shown elsewhere that a simple transmission line formulation predicts well the shielding effectiveness of a rectangular enclosure with apertures. The finite difference time-domain method is used for computing electromagnetic fields within the enclosure with apertures. The investigation is focused on the estimation of shielding effectiveness depending on the number of apertures, their area, test point location within the enclosure as well as the incidence angle and polarization of the electromagnetic field impinging on the enclosure. The obtained results allow estimation of the shielding effectiveness at the enclosure design stage
  • Keywords
    curve fitting; electromagnetic compatibility; electromagnetic coupling; electromagnetic fields; electromagnetic shielding; electromagnetic wave polarisation; finite difference time-domain analysis; packaging; EMC; FDTD method; curve fitting technique; electromagnetic energy coupling; electromagnetic field polarization; electromagnetic fields; enclosure design; finite difference time-domain method; incidence angle; phenomenological model; rectangular enclosure; shielding effectiveness estimation; test point location; transmission line formulation; Apertures; Curve fitting; Electromagnetic coupling; Electromagnetic fields; Electromagnetic modeling; Electromagnetic shielding; Finite difference methods; Numerical models; Time domain analysis; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2000. IEEE International Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-5677-2
  • Type

    conf

  • DOI
    10.1109/ISEMC.2000.874734
  • Filename
    874734