• DocumentCode
    2502489
  • Title

    Proof carrying-based information flow tracking for data secrecy protection and hardware trust

  • Author

    Jin, Yier ; Makris, Yiorgos

  • Author_Institution
    Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
  • fYear
    2012
  • fDate
    23-25 April 2012
  • Firstpage
    252
  • Lastpage
    257
  • Abstract
    We discuss a new approach for protecting the secrecy of internal information in an Integrated Circuit (IC) from malicious hardware Trojan threats and, thereby, enhancing hardware trust. The proposed approach is based on Register Transfer Level (RTL) code certification within a formal logic environment. The key novelty lies in the introduction of a new semantic model for the Verilog Hardware Description Language (HDL) in the Coq theorem-proving platform, which facilitates tracking and proving secrecy labels of internal sensitive data and, by extension, security properties of the design. Additional framework enhancements include the ability to encapsulate sub-module properties in the top module proof environment, thereby strengthening the ability of Coq representation to reason on hierarchically organized RTL code. We demonstrate the proposed framework on a DES encryption core, wherein we employ it to prevent secret information (e.g. round keys) leaking by hardware Trojans inserted at the RTL description of the circuit.
  • Keywords
    formal logic; hardware description languages; integrated circuits; security of data; theorem proving; Coq theorem-proving platform; DES encryption core; Verilog hardware description language; data secrecy protection; formal logic environment; hardware trust; integrated circuit; internal information; malicious hardware Trojan threats; proof carrying-based information flow tracking; register transfer level code certification; security properties; Hardware; Hardware design languages; Integrated circuit modeling; Semantics; Sensitivity; Trojan horses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2012 IEEE 30th
  • Conference_Location
    Hyatt Maui, HI
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-1073-4
  • Type

    conf

  • DOI
    10.1109/VTS.2012.6231062
  • Filename
    6231062