DocumentCode
2503301
Title
A novel unsupervised spike sorting algorithm for intracranial EEG
Author
Yadav, R. ; Shah, A.K. ; Loeb, J.A. ; Swamy, M.N.S. ; Agarwal, R.
Author_Institution
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
fYear
2011
fDate
Aug. 30 2011-Sept. 3 2011
Firstpage
7545
Lastpage
7548
Abstract
This paper presents a novel, unsupervised spike classification algorithm for intracranial EEG. The method combines template matching and principal component analysis (PCA) for building a dynamic patient-specific codebook without a priori knowledge of the spike waveforms. The problem of misclassification due to overlapping classes is resolved by identifying similar classes in the codebook using hierarchical clustering. Cluster quality is visually assessed by projecting inter- and intra-clusters onto a 3D plot. Intracranial EEG from 5 patients was utilized to optimize the algorithm. The resulting codebook retains 82.1% of the detected spikes in non-overlapping and disjoint clusters. Initial results suggest a definite role of this method for both rapid review and quantitation of interictal spikes that could enhance both clinical treatment and research studies on epileptic patients.
Keywords
electroencephalography; principal component analysis; waveform analysis; 3D plot; PCA; disjoint clusters; dynamic patient-specific codebook; epileptic patients; hierarchical clustering; interclusters; intraclusters; intracranial EEG; nonoverlapping clusters; principal component analysis; spike waveforms; template matching; unsupervised spike classification algorithm; unsupervised spike sorting algorithm; Clustering algorithms; Correlators; Electroencephalography; Epilepsy; Principal component analysis; Sorting; Three dimensional displays; EEG; PCA; clustering; interictal spike; Action Potentials; Algorithms; Brain; Cluster Analysis; Electroencephalography; Epilepsy; Humans; Principal Component Analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location
Boston, MA
ISSN
1557-170X
Print_ISBN
978-1-4244-4121-1
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2011.6091860
Filename
6091860
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