Proceedings 2012 30th IEEE VLSI Test Symposium - VTS 2012 [Copyright notice]

Copyright (c) 2012 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Copyright and Reprint Permissions: Abstracting is permitted with credit to the source. Libraries may photocopy beyond the limits of US copyright law, for private use of patrons, those articles in this volume that carry a code at the bottom of the fi rst page, provided that the per-copy fee indicated in the code is paid through the Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923. The papers in this CD-ROM comprise the proceedings of the meeting mentioned on the cover and title page. They refl ect the authors?? opinions and, in the interests of timely dissemination, are published as presented and without change. Th eir inclusion in this publication does not necessarily constitute endorsement by the editors, the IEEE Computer Society, or the Institute of Electrical and Electronics Engineers, Inc.