DocumentCode
2503360
Title
VTS 2011 Best Paper Award
Author
Prinetto, Paolo ; Maxwell, Peter ; Varma, Prab ; Singh, Adit ; Thibeault, Claude
Author_Institution
Politecnico di Torino, Italy
fYear
2012
fDate
23-25 April 2012
Abstract
Each year, VTS proudly presents the Best Paper Award to the author(s) of the most outstanding paper from those presented at the previous year´s symposium. The candidates for this honor are initially selected based solely on the numerical ratings of the reviewers and symposium attendees, as recorded on the review forms and the session rating cards. The Best Paper Award Judges then carefully review the candidate papers as published in the proceedings. The judges provide numerical scores and comments for each candidate paper. The scores and comments are compiled to select the best paper.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location
Maui, HI, USA
ISSN
1093-0167
Print_ISBN
978-1-4673-1073-4
Type
conf
DOI
10.1109/VTS.2012.6231109
Filename
6231109
Link To Document