DocumentCode
2503598
Title
Single View Metrology Along Orthogonal Directions
Author
Peng, Kun ; Hou, Lulu ; Ren, Ren ; Ying, Xianghua ; Zha, Hongbin
Author_Institution
Key Lab. of Machine Perception (Minist. of Eduction), Peking Univ., Beijing, China
fYear
2010
fDate
23-26 Aug. 2010
Firstpage
1658
Lastpage
1661
Abstract
In this paper, we describe how 3D metric measurements can be determined from a single uncalibrated image, when only minimal geometric information are available in the image. The minimal information just is orthogonal vanishing points. Given such limited information, we show that the length ratios on different orthogonal directions can be directly computed. The exciting discovery of the method seems to oppose common senses: Usually, in the calibration process, all edge-lengths of cuboid are known, in this paper, cuboid edge-lengths are unknown but its edge-lengths ratios can be recovered from image. 3D metric measurements can be directly computed from the image using our linear method.
Keywords
geometry; image processing; solid modelling; 3D metric measurement; calibration process; cuboid edge-length; geometric information; length ratio; orthogonal direction; orthogonal vanishing point; single uncalibrated image; single view metrology; Calibration; Cameras; Computer vision; Length measurement; Metrology; Three dimensional displays; 3D metric measurements; Linear method; Orthogonal vanishing points; Single uncalibrated image;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location
Istanbul
ISSN
1051-4651
Print_ISBN
978-1-4244-7542-1
Type
conf
DOI
10.1109/ICPR.2010.410
Filename
5597230
Link To Document