• DocumentCode
    2503866
  • Title

    Novel fast cure and reworkable underfill materials

  • Author

    Ma, Bojiang ; Tong, Qiaoling

  • Author_Institution
    Nat. Starch and Chem. Co., Bridgewater, NJ
  • fYear
    1998
  • fDate
    28-30 Sep 1998
  • Firstpage
    252
  • Lastpage
    255
  • Abstract
    A novel fast flow, fast cure and reworkable underfill material has been developed. This nonepoxy material satisfies all the basic requirements for underfill materials, such as high glass transition temperature, low viscosity and low thermal expansion coefficient. During laboratory testing, this underfill exhibits excellent flow behavior (about 10 seconds for a quarter inch die), and fast curability (less than 5 minutes at 150°C). A distinct feature of this underfill material is its reworkability. Rework was achieved by thermal removal of the silicon die, followed by solvent cleaning of the underfill residue. Laboratory work demonstrates that the chip removal and underfill clean-up process can be completed within 5 minutes
  • Keywords
    encapsulation; glass transition; heat treatment; integrated circuit packaging; integrated circuit testing; maintenance engineering; surface cleaning; surface contamination; thermal expansion; viscosity; 0.25 in; 10 s; 150 C; 5 min; Si; chip removal; curability; fast cure underfill materials; fast flow underfill material; glass transition temperature; nonepoxy material; rework; reworkability; reworkable underfill materials; solvent cleaning; thermal expansion coefficient; thermal silicon die removal; underfill clean-up process; underfill flow behavior; underfill materials; underfill residue; viscosity; Chemicals; Flip chip; Glass; Laboratories; Packaging; Solvents; Temperature; Testing; Thermal expansion; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Adhesive Joining and Coating Technology in Electronics Manufacturing, 1998. Proceedings of 3rd international Conference on
  • Conference_Location
    Binghamton, NY
  • Print_ISBN
    0-7803-4934-2
  • Type

    conf

  • DOI
    10.1109/ADHES.1998.742035
  • Filename
    742035