DocumentCode
2503866
Title
Novel fast cure and reworkable underfill materials
Author
Ma, Bojiang ; Tong, Qiaoling
Author_Institution
Nat. Starch and Chem. Co., Bridgewater, NJ
fYear
1998
fDate
28-30 Sep 1998
Firstpage
252
Lastpage
255
Abstract
A novel fast flow, fast cure and reworkable underfill material has been developed. This nonepoxy material satisfies all the basic requirements for underfill materials, such as high glass transition temperature, low viscosity and low thermal expansion coefficient. During laboratory testing, this underfill exhibits excellent flow behavior (about 10 seconds for a quarter inch die), and fast curability (less than 5 minutes at 150°C). A distinct feature of this underfill material is its reworkability. Rework was achieved by thermal removal of the silicon die, followed by solvent cleaning of the underfill residue. Laboratory work demonstrates that the chip removal and underfill clean-up process can be completed within 5 minutes
Keywords
encapsulation; glass transition; heat treatment; integrated circuit packaging; integrated circuit testing; maintenance engineering; surface cleaning; surface contamination; thermal expansion; viscosity; 0.25 in; 10 s; 150 C; 5 min; Si; chip removal; curability; fast cure underfill materials; fast flow underfill material; glass transition temperature; nonepoxy material; rework; reworkability; reworkable underfill materials; solvent cleaning; thermal expansion coefficient; thermal silicon die removal; underfill clean-up process; underfill flow behavior; underfill materials; underfill residue; viscosity; Chemicals; Flip chip; Glass; Laboratories; Packaging; Solvents; Temperature; Testing; Thermal expansion; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Adhesive Joining and Coating Technology in Electronics Manufacturing, 1998. Proceedings of 3rd international Conference on
Conference_Location
Binghamton, NY
Print_ISBN
0-7803-4934-2
Type
conf
DOI
10.1109/ADHES.1998.742035
Filename
742035
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