DocumentCode
2504834
Title
Thermal analysis of integrated polymer waveguides
Author
Stanowski, Radoslaw ; Rieske, Ralf ; Patela, Sergiusz ; Wolter, Klaus-juergen
Author_Institution
Fac. of Microsystems Electron. & Photonics, Wroclaw Univ. of Technol., Poland
fYear
2003
fDate
8-11 May 2003
Firstpage
227
Lastpage
231
Abstract
Optical interconnection technology will be indispensable for high-bandwidth signal transmission in future transmission systems. The optical attenuation of light-guiding structures incorporated into printed circuit boards is an important quality characteristic and can be useful to describe the reliability of the waveguides. The purpose of the analysis described in this paper is to determine the functional behaviour of an integrated polymer waveguide under thermal stress. The data obtained will be used to conclude about occurring degradation mechanisms. In order to measure the optical attenuation under elevated temperature dedicated set-ups have been developed. One special set-up allows attenuation measurements with an increased repeatability by utilization of an immersion liquid. It also enables one to continuously track the changes of the optical losses at different temperatures. Main purpose of the measurement is testing the reliability of new elaborated technology of polymer waveguides. First measurement results were presented.
Keywords
attenuation measurement; integrated optics; optical interconnections; optical losses; optical polymers; optical waveguides; reliability; thermal stresses; attenuation measurements; degradation mechanisms; immersion liquid; integrated polymer waveguides; light-guiding structures; optical attenuation; optical interconnection technology; optical losses; printed circuit boards; signal transmission; thermal analysis; thermal stress; transmission systems; waveguides reliability; Attenuation measurement; Integrated circuit reliability; Integrated circuit technology; Optical attenuators; Optical interconnections; Optical polymers; Optical waveguides; Printed circuits; Temperature; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology: Integrated Management of Electronic Materials Production, 2003. 26th International Spring Seminar on
Print_ISBN
0-7803-8002-9
Type
conf
DOI
10.1109/ISSE.2003.1260521
Filename
1260521
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