Efficient method of moment analysis based on imaging and edging

Electromagnetic modeling of composite metallic and dielectric structures (antennas, scatterers, microwave circuits, etc.) in the frequency domain can be efficiently performed by applying the method of moments (MoM) to the surface integral equations (SIEs). Particularly, a high efficiency is achieved by using double polynomial approximations for currents over quadrilateral patches, where expansion orders are directly proportional to the electrical length of these patches. The exception occurs when a global solution for currents is strongly affected by local quasi-static effects (end effect and proximity effect). For example, the authors consider a microstrip line whose transversal dimensions are small comparable with the wavelength. The main goal is to determine non-uniform segmentation which enables the treatment of local quasi-static effects with the lowest number of unknowns. In that sense two techniques are proposed: imaging and edging.