• DocumentCode
    2506647
  • Title

    Supervised gene clustering for extraction of discriminative features from microarray data

  • Author

    Das, Chandra ; Maji, Pradipta ; Chattopadhyay, Samiran

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Netaji Subhash Eng. Coll., Kolkata, India
  • fYear
    2010
  • fDate
    17-19 Dec. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Among the large number of genes presented in microarray data, only a small fraction of them are effective for performing a certain diagnostic test. However, it is very difficult to identify these genes for disease diagnosis. In this regard, a new supervised gene clustering algorithm is proposed to cluster genes from microarray data. The proposed method directly incorporates the information of response variables in the grouping process for finding such groups of genes. Significant cluster representatives are then taken to form the reduced feature set that can be used to build the classifiers with very high classification accuracy. The effectiveness of the proposed method, along with a comparison with existing methods, is demonstrated on three microarray data sets based on predictive accuracy of the naive Bayes´ classifier, the K-nearest neighbor rule, and the support vector machine.
  • Keywords
    Bayes methods; feature extraction; gene therapy; genomics; molecular biophysics; patient diagnosis; pattern classification; pattern clustering; support vector machines; K-nearest neighbor; diagnostic test; discriminative feature extraction; disease diagnosis; feature set reduction; microarray data; naive Bayes classifier; predictive accuracy; supervised gene clustering algorithm; support vector machine; Accuracy; Cancer; Clustering algorithms; Gene expression; Mutual information; Niobium; Support vector machines; Microarray analysis; classification; feature selection; gene selection; mutual information;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Conference (INDICON), 2010 Annual IEEE
  • Conference_Location
    Kolkata
  • Print_ISBN
    978-1-4244-9072-1
  • Type

    conf

  • DOI
    10.1109/INDCON.2010.5712629
  • Filename
    5712629