• DocumentCode
    2506750
  • Title

    A two-degree-of-freedom control scheme for integrating and unstable delay processes

  • Author

    Padhan, Dola Gobinda ; Majhi, Somanaath

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Indian Inst. of Technol., Guwahati, India
  • fYear
    2010
  • fDate
    17-19 Dec. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A two-degree-of-freedom control scheme is proposed for enhanced control performance of integrating and unstable processes with time delay. The two controllers in the scheme are well placed to tune from the setpoint and disturbance. The design steps of these two controllers are independent. The H2 optimal control method is used to design the set-point tracking controller and an optimal internal model control (IMC) filter structure is proposed to design a proportional-integral-derivative (PID) controller that produces an improved disturbance rejection response. The setpoint and load disturbance responses can each be tuned conveniently by a single control parameter. Especially, improvement of disturbance response is extremely great compared with recently reported methods. Illustrative examples show the simplicity and superiority of the proposed controller design method over previously published approaches both for the setpoint response and for the load disturbance rejection.
  • Keywords
    H control; control system synthesis; delays; three-term control; H2 optimal control method; PID controller; controller design; load disturbance rejection; optimal internal model control filter structure; proportional-integral-derivative controller; set-point tracking controller; time delay; two-degree-of-freedom control scheme; unstable delay processes; Control systems; Delay effects; Design methodology; Load modeling; Process control; Robust stability; Tuning; Integrating process; Internal model control; Modified Smith predictor; Time Delay; Unstable process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Conference (INDICON), 2010 Annual IEEE
  • Conference_Location
    Kolkata
  • Print_ISBN
    978-1-4244-9072-1
  • Type

    conf

  • DOI
    10.1109/INDCON.2010.5712635
  • Filename
    5712635