• DocumentCode
    2507410
  • Title

    PWB deflection vs. vibration-induced solder joint deformation

  • Author

    Hevel, Elliot ; Jianmin Qu

  • Author_Institution
    Dept. of Mech. Eng., Northwestern Univ., Evanston, IL, USA
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    762
  • Lastpage
    764
  • Abstract
    Vibration-induced solder joint failure is one of the common failure modes in microelectronics used in the automotive and the aerospace industries. In most of these applications, printed wiring boards (PWBs) with multiple surface-mount components are attached to a base frame through either sockets, clamps, or receptacles. Since the base frame is typically attached to the vehicle, the vehicle´s vibration causes the PWB to vibrate. Transverse vibration of the PWB results in significant board deflection. Deflection of the PWB induces significant strain of the solder joints on the surface-mounted components. PWB deflection is one of the parameters that can be easily measured during a vibration test. Therefore, it is often used as a design parameter. Intuitively, it is plausible that larger deflection induces more strain on the solder joints, thus results in failure. However, to design the PWB and its fixture against vibration-induced solder joint failure, it is critical to understand the quantitative relationship between the deflection of the PWB and the corresponding deformation of the solder joints. In this work, a semi-analytical method is developed to calculate the strain in the solder joints for a given magnitude of PWB deflection. Input parameters to the calculations include the PWB size, mass, modulus, types of fixture, package size, solder geometry, elastic-plastic properties of the solder alloys, etc. The methodology is semi-analytical in that the solutions are given in explicit expressions and the evaluation of these expressions requires very minimum numerical computations that can be accomplished without the need for high performance computers. More importantly, these semi-analytical solutions provide a convenient way to gain deeper physical insights and the understanding of effects of various parameters, allowing the designer to test multiple “what if” scenarios quickly.
  • Keywords
    deformation; dynamic testing; failure analysis; integrated circuit packaging; integrated circuit reliability; printed circuits; solders; surface mount technology; vibrations; PWB deflection; aerospace industries; automotive; board deflection; clamps; elastic-plastic property; failure modes; microelectronics; printed wiring boards; receptacles; semianalytical method; sockets; solder alloys; solder geometry; surface-mount components; transverse vibration; vehicle vibration; vibration test; vibration-induced solder joint deformation; vibration-induced solder joint failure; Arrays; Equations; Joints; Shape; Soldering; Strain; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-9533-7
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2012.6231504
  • Filename
    6231504