DocumentCode
2508994
Title
Synthesis of low power high performance dual-VT PTL circuits
Author
Samanta, Debasis ; Pal, Ajit
Author_Institution
Dept. of Comput. Sci. & Eng., North Eastern Regional Inst. of Sci. & Technol., Nirjuli, India
fYear
2004
fDate
2004
Firstpage
85
Lastpage
90
Abstract
Although major portion of power dissipation in present generation CMOS circuits (250 nm-180 nm) is due to charging and discharging of various node capacitors, known as switching power, the leakage power is becoming more and more predominant in ultra-deep submicron (UDSM) technologies. In pass-transistor logic (PTL) circuits, the output of each PTL cell is provided with a buffer to reduce delay and restore voltage level. These buffers, in turn, are the primary source of leakage power in PTL circuits. In this paper we have proposed, for the first time, the use of transistors of two threshold voltages (dual-VT) to minimize leakage power. We have extended our existing algorithm for logic synthesis of dual-VT PTL circuits. The extended algorithm has been tested for a large number of ISCAS benchmark circuits. Experimental results show that the use of dual-VT leads to a reduction in leakage power of about 45% in active mode and 76% in standby mode compared to their single-VT realization. Moreover, total power dissipation reduces by 18% with respect to single-VT realizations.
Keywords
CMOS integrated circuits; circuit optimisation; leakage currents; logic circuits; low-power electronics; CMOS circuits; benchmark circuits; capacitor charging; capacitor discharging; circuit optimisation; circuit synthesis; complementary metal oxide semiconductor; delay; dual threshold voltages; leakage power; logic synthesis; low power high performance circuits; node capacitors; pass transistor logic circuits; power dissipation; switching power; ultra deep submicron technologies; CMOS logic circuits; CMOS technology; Circuit synthesis; Circuit testing; Delay; Logic circuits; Power dissipation; Power generation; Switched capacitor circuits; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN
0-7695-2072-3
Type
conf
DOI
10.1109/ICVD.2004.1260907
Filename
1260907
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