DocumentCode
2509283
Title
Electron and proton radiation effects on GaAs and CuInSe2 thin film solar cells
Author
Burgess, R.M. ; Chen, W.S. ; Devaney, W.E. ; Doyle, D.H. ; Kim, N.P. ; Stanbery, B.J.
Author_Institution
Boeing High Technol. Center, Seattle, WA, USA
fYear
1988
fDate
1988
Firstpage
909
Abstract
The effects of proton and electron radiation on the performances of GaAs and CuInSe2/CdZnS (CIS) thin-film solar cells are evaluated. Bare cells (i.e. with no coverglass) were exposed to several energies of electron and proton radiation, and their performances were monitored by illuminated I-V curves, dark I-V curves, and spectral response measurements at different fluence levels. These experiments reconfirm that no measurable damage occurs to CIS solar cells when exposed to 1 and 2 MeV electrons to a total fluence of 5.0*1015 cm-2. For proton irradiations, the results indicate that CIS cells are more radiation resistant than GaAs cells, by a factor of ten, when compared at the same energy levels. Comparison of the electron and proton irradiation results to those reported in the literature shows that the thin-film GaAs solar cells are as radiation resistant as other GaAs bulk cells at 1.0 MeV protons and are more radiation resistant at both the 1.0 MeV electron and 200 keV proton energies.
Keywords
II-VI semiconductors; III-V semiconductors; cadmium compounds; copper compounds; electron beam effects; gallium arsenide; proton effects; semiconductor thin films; solar cells; ternary semiconductors; zinc compounds; 1 MeV; 2 MeV; 200 keV; CuInSe2-CdZnS; GaAs; I-V curves; electron radiation; fluence levels; performances; proton irradiation; semiconductor thin films; spectral response; thin film solar cells; Computational Intelligence Society; Electrons; Energy measurement; Energy states; Gallium arsenide; Performance evaluation; Photovoltaic cells; Proton radiation effects; Radiation monitoring; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location
Las Vegas, NV, USA
Type
conf
DOI
10.1109/PVSC.1988.105835
Filename
105835
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