DocumentCode
2509716
Title
Fan-Beam Short Scan SPECT with Uniform Attenuation
Author
Huang, Qiu ; You, Jiangsheng ; Zeng, Gengsheng L.
Author_Institution
Utah Center for Adv. Imaging Res., Univ. Utah, Salt Lake City, UT
Volume
4
fYear
2006
fDate
Oct. 29 2006-Nov. 1 2006
Firstpage
2242
Lastpage
2244
Abstract
It is well known that in fan-beam X-ray computed tomography (CT) projection data acquired over 2pi contain redundant information and that accurate and stable reconstruction can be obtained from less than 2pi data. In single photon emission computed tomography (SPECT), since the photon absorption is distance-dependent, the conjugate projections are not identical even in the absence of noise. However, projection data over 2pi are still redundant for a noiseless image reconstruction except that the redundancy is not as apparent as in X-ray CT. We study the redundant information in the fan-beam SPECT projection data in this work and developed a reconstruction algorithm only requiring data measured over a short scan. Experiment with computer-simulated data is performed to establish the validity and efficiency of the solution. Besides the explicit inversion formula, the most significant property of the algorithm is that truncations are allowed in the projection data along the detector at each view angle, which makes the reconstruction of region of interest (ROI) feasible in some particular geometries.
Keywords
computerised tomography; image reconstruction; light absorption; single photon emission computed tomography; X-ray CT projection; fan-beam X-ray computed tomography; fan-beam short scan SPECT; noiseless image reconstruction; photon absorption; redundant information; region of interest; single photon emission computed tomography; Attenuation; Computed tomography; Detectors; Electromagnetic wave absorption; Geometry; Image reconstruction; Noise measurement; Reconstruction algorithms; Single photon emission computed tomography; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location
San Diego, CA
ISSN
1095-7863
Print_ISBN
1-4244-0560-2
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2006.354360
Filename
4179474
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