DocumentCode
2510206
Title
Two Models of Digital Forensic Examination
Author
Cohen, Fred
Author_Institution
California Sci. Inst., CA, USA
fYear
2009
fDate
21-21 May 2009
Firstpage
42
Lastpage
53
Abstract
This paper examines an existing cost model of digital forensic evidence examination, identifies minor optimization improvements to that model, describes a new model, and uses the new model to show some fundamental theoretical limits of examination.
Keywords
computer crime; forensic science; digital forensic evidence examination; forensic science; trace evidence theory; Clothing; Conferences; Cost function; Digital forensics; Error analysis; Fabrics; Hair; Law; Legal factors; Skin; Digital forensics; analysis; trace consistency;
fLanguage
English
Publisher
ieee
Conference_Titel
Systematic Approaches to Digital Forensic Engineering, 2009. SADFE '09. Fourth International IEEE Workshop on
Conference_Location
Berkeley, CA
Print_ISBN
978-0-7695-3792-4
Type
conf
DOI
10.1109/SADFE.2009.8
Filename
5341554
Link To Document