DocumentCode
2511063
Title
Modeling MTF and DQE for Arbitrary Scintillator Thickness
Author
Zelakiewicz, Scott ; Shaw, Jeffrey
Author_Institution
Gen. Electr. Res. Center, Niskayuna, NY
Volume
4
fYear
2006
fDate
Oct. 29 2006-Nov. 1 2006
Firstpage
2551
Lastpage
2553
Abstract
Modeling the detective quantum efficiency (DQE) performance of a digital X-ray detector is critically dependent on an accurate representation of the modulation transfer function (MTF). Accurate MTF models that are valid for arbitrary thicknesses and spectra are difficult to formulate for CsI partially due to the needle structure present. We present a model for MTF based on cascaded system theory by dividing the scintillator into numerous thinner layers. The spreading of the light in each of these layers is compounded over the entire scintillator thickness. Using this method we are able to reproduce the MTF for scintillators with thicknesses ranging from 100 to 800mum for varying spectrum energy using two global fit parameters. Using these results, the DQE is then calculated using a cascaded system approach. We present the modeling results of MTF and DQE together with experimental data to demonstrate the ability to accurate predict system performance.
Keywords
X-ray detection; caesium compounds; scintillation; sensors; transfer functions; 100 to 800 micron; CsI; arbitrary scintillator thickness; cascaded system theory; detective quantum efficiency; digital X-ray detector; modulation transfer function; Digital modulation; Needles; Nuclear and plasma sciences; Optical attenuators; Photodiodes; Power system modeling; Predictive models; Transfer functions; X-ray detection; X-ray detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location
San Diego, CA
ISSN
1095-7863
Print_ISBN
1-4244-0560-2
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2006.354429
Filename
4179543
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