• DocumentCode
    2511390
  • Title

    Reset careabouts in a SoC design

  • Author

    Das, Subrangshu ; Chandar, Subash ; Tiwari, Ashutosh

  • Author_Institution
    Texas Instrum. India Ltd., Bangalore, India
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    788
  • Lastpage
    791
  • Abstract
    Advances in VLSI technology have enabled designers to integrate more functionality in one chip. One of the major design complexities arising from this is defining the reset architecture for a SoC, especially when there are multiple clock domains. Incorrect assumptions or overlooked issues might cause silicon bugs requiring costly re-spins or even worse to a missed opportunity. In this paper, various careabouts that help achieve first pass silicon success as well as reduced verification and manufacturing test generation effort with respect to the reset signal and the reset state are described.
  • Keywords
    VLSI; system-on-chip; SoC design; VLSI technology; design complexity; multiple clock domains; reset architecture; silicon bugs; system on chip; very large scale integration; Clocks; Delay; Flip-flops; Instruments; Logic; Pipelines; Protocols; Signal design; Synchronization; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2004. Proceedings. 17th International Conference on
  • Print_ISBN
    0-7695-2072-3
  • Type

    conf

  • DOI
    10.1109/ICVD.2004.1261029
  • Filename
    1261029