DocumentCode
2511390
Title
Reset careabouts in a SoC design
Author
Das, Subrangshu ; Chandar, Subash ; Tiwari, Ashutosh
Author_Institution
Texas Instrum. India Ltd., Bangalore, India
fYear
2004
fDate
2004
Firstpage
788
Lastpage
791
Abstract
Advances in VLSI technology have enabled designers to integrate more functionality in one chip. One of the major design complexities arising from this is defining the reset architecture for a SoC, especially when there are multiple clock domains. Incorrect assumptions or overlooked issues might cause silicon bugs requiring costly re-spins or even worse to a missed opportunity. In this paper, various careabouts that help achieve first pass silicon success as well as reduced verification and manufacturing test generation effort with respect to the reset signal and the reset state are described.
Keywords
VLSI; system-on-chip; SoC design; VLSI technology; design complexity; multiple clock domains; reset architecture; silicon bugs; system on chip; very large scale integration; Clocks; Delay; Flip-flops; Instruments; Logic; Pipelines; Protocols; Signal design; Synchronization; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN
0-7695-2072-3
Type
conf
DOI
10.1109/ICVD.2004.1261029
Filename
1261029
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