• DocumentCode
    2511964
  • Title

    Optimization of Image Fusion using Genetic Algorithms and Discrete Wavelet Transform

  • Author

    Lacewell, Chaunté W. ; Gebril, Mohamed ; Buaba, Ruben ; Homaifar, Abdollah

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina Agric. & Tech. State Univ., Greensboro, NC, USA
  • fYear
    2010
  • fDate
    14-16 July 2010
  • Firstpage
    116
  • Lastpage
    121
  • Abstract
    Image fusion is the process of combining the most relevant information from multiple source images to obtain an accurate fused image. In this paper, we want to fuse visual and thermal satellite images. In order to provide enhanced information, we have investigated techniques of image fusion to obtain the most accurate information. This paper presents a technique which will produce an accurate fused image using discrete wavelet transform (DWT) for feature extraction and using Genetic Algorithms (GAs) to get the more optimized combined image. The performance of the proposed image fusion scheme is evaluated with mutual information (MI), root mean square error (RMSE), and it is also compared to the fused image that is generated by using Pixel Level GA based Image Fusion (PLGA_IF) and Discrete Wavelet Transform based Image Fusion (DWT_IF) techniques. Simulation results conducted with DWT and GA show that the proposed method outperforms the existing image fusion algorithms.
  • Keywords
    discrete wavelet transforms; feature extraction; genetic algorithms; image fusion; mean square error methods; discrete wavelet transform; feature extraction; image fusion algorithms; multiple source images; mutual information; optimization; pixel level genetic algorithms; root mean square error; thermal satellite images; visual images; Discrete wavelet transforms; Gallium; Genetics; Image fusion; Satellites; Search problems; Discrete Wavelet Transform; feature vectors; genetic algorithms; image fusion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference (NAECON), Proceedings of the IEEE 2010 National
  • Conference_Location
    Fairborn, OH
  • ISSN
    0547-3578
  • Print_ISBN
    978-1-4244-6576-7
  • Type

    conf

  • DOI
    10.1109/NAECON.2010.5712933
  • Filename
    5712933