DocumentCode
2512707
Title
Cumulative bibliography of articles on semiconductor thermal and temperature testing
Author
Siegal, Bernard
Author_Institution
Sage Enterprises Inc., Mountain View, CA, USA
fYear
1988
fDate
10-12 Feb 1988
Firstpage
137
Lastpage
152
Abstract
The bibliography given contains both journal and conference items, from as early as 1968, but primarily from 1980 to the present. All the entries listed in the bibliography provide information on semiconductor thermal and/or temperature characteristics, measurement techniques and results, hardware applications, and other pertinent information
Keywords
heat sinks; integrated circuit testing; packaging; semiconductor device testing; temperature measurement; thermal variables measurement; bibliography; semiconductor thermal characteristics; temperature characteristics; temperature testing; Bibliographies; Electronic packaging thermal management; Integrated circuit packaging; Microscopy; Plastics; Semiconductor device testing; Temperature measurement; Thermal management of electronics; Thermal stresses; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal and Temperature Measurement Symposium, 1988. SEMI-THERM IV., Fourth Annual IEEE
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/SEMTHE.1988.10615
Filename
10615
Link To Document