• DocumentCode
    2513134
  • Title

    A new methodology to measure electromagnetic interferences in 3G mobile platform

  • Author

    Baffreau, Stéphane ; Akue-Boulingui, Samuel ; Dupoux, Céline ; Sicard, Etienne ; Bouvier, Nicolas ; Vrignon, Bertrand ; Boyer, Alexandre

  • Author_Institution
    IUT Tarbes-Lattis, Univ. of Toulouse 1, Toulouse, France
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    1076
  • Lastpage
    1079
  • Abstract
    This paper presents a new methodology to measure electromagnetic interferences in 3G mobile platform. The main objectives of this approach are to evaluate the near field coupling between two integrated circuits, and validate, in a predictive way, that the two devices can be mounted in a same package. The methodology consists in emulating the near field electromagnetic behavior of a disruptive chip. The emulation of the aggressor device is performed by means of a specific probe. Then a risk of interference analysis is performed to validate the EMC compliance between the two chips. This analysis provides valuable information about sensitive areas, coupling orientation and critical coupling distances by means of extraction. Details of this methodology are illustrated through a 3G mobile platform. Using this approach, chip-to-chip interferences can be investigated without requiring any specific EMC test board and with a low cost near field emulator.
  • Keywords
    3G mobile communication; integrated circuits; radiofrequency interference; 3G mobile platform; EMC compliance; chip-to-chip interferences; electromagnetic interference measurement; interference analysis; near field coupling; near field electromagnetic behavior; Coupling circuits; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Emulation; Integrated circuit measurements; Integrated circuit packaging; Probes; Risk analysis; 3G platform; EMC; chip to chip coupling; mobile phone; near-field; system-in-package;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475647
  • Filename
    5475647