DocumentCode
2513134
Title
A new methodology to measure electromagnetic interferences in 3G mobile platform
Author
Baffreau, Stéphane ; Akue-Boulingui, Samuel ; Dupoux, Céline ; Sicard, Etienne ; Bouvier, Nicolas ; Vrignon, Bertrand ; Boyer, Alexandre
Author_Institution
IUT Tarbes-Lattis, Univ. of Toulouse 1, Toulouse, France
fYear
2010
fDate
12-16 April 2010
Firstpage
1076
Lastpage
1079
Abstract
This paper presents a new methodology to measure electromagnetic interferences in 3G mobile platform. The main objectives of this approach are to evaluate the near field coupling between two integrated circuits, and validate, in a predictive way, that the two devices can be mounted in a same package. The methodology consists in emulating the near field electromagnetic behavior of a disruptive chip. The emulation of the aggressor device is performed by means of a specific probe. Then a risk of interference analysis is performed to validate the EMC compliance between the two chips. This analysis provides valuable information about sensitive areas, coupling orientation and critical coupling distances by means of extraction. Details of this methodology are illustrated through a 3G mobile platform. Using this approach, chip-to-chip interferences can be investigated without requiring any specific EMC test board and with a low cost near field emulator.
Keywords
3G mobile communication; integrated circuits; radiofrequency interference; 3G mobile platform; EMC compliance; chip-to-chip interferences; electromagnetic interference measurement; interference analysis; near field coupling; near field electromagnetic behavior; Coupling circuits; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Emulation; Integrated circuit measurements; Integrated circuit packaging; Probes; Risk analysis; 3G platform; EMC; chip to chip coupling; mobile phone; near-field; system-in-package;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5621-5
Type
conf
DOI
10.1109/APEMC.2010.5475647
Filename
5475647
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