Experimental verification for field to transmission line coupling using TEM cell

Author

Park, Beom Jun ; Ju, Jae Cheol ; Lee, Hyun Young ; Park, Dong Chul

Author_Institution

Dept. of Radio Sci. & Eng., Chungnam Nat. Univ., Taejon, South Korea

Volume

1

fYear

2000

fDate

2000

Firstpage

213

Abstract

Although several papers have been published on undesired electromagnetic coupling on multiconductor transmission lines (MTLs) due to an incident electromagnetic pulse, experimental validations in the time-domain are rarely found. This paper presents an accurate and simple experimental verification for the field to transmission line coupling using a TEM cell. The measured results are in good agreement with simulated ones obtained by the finite difference-time domain (FDTD) method

Keywords

electromagnetic compatibility; electromagnetic coupling; electromagnetic fields; electromagnetic pulse; finite difference time-domain analysis; multiconductor transmission lines; test facilities; EM field to transmission line coupling; EMC measurement; EMI measurement; FDTD method; TEM cell; electromagnetic compatibility; electromagnetic coupling; experimental verification; finite difference-time domain method; incident electromagnetic pulse; line losses; linear loads; measured results; multiconductor transmission lines; shielded environment; simulated results; time-domain validations; transverse electromagnetic cell; Conductors; EMP radiation effects; Electromagnetic coupling; Electromagnetic measurements; Impedance; TEM cells; Time domain analysis; Transmission line measurements; Transmission line theory; Transmission lines;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2000. IEEE International Symposium on

Conference_Location

Washington, DC

Print_ISBN

0-7803-5677-2

Type

conf

DOI

10.1109/ISEMC.2000.875565

Filename

875565