• DocumentCode
    2514505
  • Title

    Multi-classifier Q-stack Aging Model for Adult Face Verification

  • Author

    Li, Weifeng ; Drygajlo, Andrzej

  • Author_Institution
    Swiss Fed. Inst. of Technol. Lausanne (EPFL), Lausanne, Switzerland
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    1310
  • Lastpage
    1313
  • Abstract
    The influence of age progression on the performance of multi-classifier face verification systems is a challenging and largely open research problem that deserves more and more attention. In this paper, we propose to manage the aging influence on the adult face verification system by a multi-classifier Q-stack age modeling technique, which uses the age as a class-independent metadata quality measure together with scores from baseline classifiers, combining global and local patterns, in order to obtain better recognition rates. This allows for improved long-term class separation by introducing a 2D parameterized decision boundary in the scores-age space using a short-term enrollment model. This new method, based on the concept of classifier stacking and age-dependent decision boundary, compares favorably with the conventional face verification approach, which uses age-independent decision threshold calculated only in the score space at the time of enrollment. The proposed approach is evaluated on the MORPH database.
  • Keywords
    face recognition; image classification; 2D parameterized decision boundary; adult face verification; age progression; age-dependent decision boundary; class-independent metadata quality; classifier stacking; multiclassifier Q-stack aging model; multiclassifier face verification; scores-age space; short-term enrollment model; Aging; Databases; Face; Face recognition; Principal component analysis; Training; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.326
  • Filename
    5597781