• DocumentCode
    2515086
  • Title

    Mobile test systems for flightline and forward battle areas

  • Author

    Buchholz, Thomas W.

  • Author_Institution
    Div. of Electron. Systs., Northrop Grumman Corp., Rolling Meadows, IL, USA
  • fYear
    1994
  • fDate
    20-22 Sep 1994
  • Firstpage
    507
  • Lastpage
    508
  • Abstract
    Mobile testers are rapidly becoming a critical ingredient in present and future military automatic test equipment strategies and procurements. Lightweight, portable testers are required in flightline, at forward battle areas and in rapid deployment operations. These portable testers must have RF and microwave testing capabilities which until now have not been easily available in small, portable systems. This paper focuses on a systems approach in using digital signal processing (DSP) and monolithic microwave integrated circuits (MMIC) in developing portable testers. Leading edge MMIC technology has enabled RF/microwave systems to be downsized for completely portable flightline and field use. Future defense programs such as Joint Services Electronic Combat System Tester (JSECST) will emphasize this capability
  • Keywords
    MMIC; automatic test equipment; digital signal processing chips; microwave measurement; military equipment; portable instruments; radio applications; FFT; Joint Services Electronic Combat System Tester; MMIC; RF; RF/microwave systems; VXI; defense programs; digital signal processing; field use; flightline; forward battle areas; microwave testing; military automatic test equipment; mobile test systems; monolithic microwave integrated circuits; portable testers; procurements; rapid deployment operations; Automatic test equipment; Automatic testing; Circuit testing; Digital signal processing; MMICs; Microwave devices; Military equipment; Procurement; Radio frequency; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1910-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1994.381576
  • Filename
    381576