• DocumentCode
    2515125
  • Title

    EMC challenges and mitigation methodologies for contemporary mobile phones

  • Author

    Huang, Jingyu

  • Author_Institution
    Device R&D, Nokia, Beijing Economic & Technol. Dev. Area, Beijing, China
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    44
  • Lastpage
    47
  • Abstract
    Challenges in today´s mobile phone design are analyzed, and typical mitigation methodologies that can effectively surmount those challenges are presented.
  • Keywords
    electromagnetic compatibility; mobile handsets; EMC mitigation; electromagnetic compatibility; mobile phones; Costs; Electromagnetic compatibility; Electromagnetic interference; Electrostatic discharge; Immunity testing; Light emitting diodes; Mobile handsets; RF signals; Radio frequency; Radiofrequency interference;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475748
  • Filename
    5475748
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2515125