Bit Cell Aspect Ratio: An SNR And Detection Perspective

Author

Arnoldussen, T.C.

Author_Institution

IBM Corp.

fYear

1998

fDate

6-9 Jan. 1998

Firstpage

349

Lastpage

349

Keywords

Eigenvalues and eigenfunctions; Noise level; Signal to noise ratio; Space vector pulse width modulation; Thermal stability; Timing jitter; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

MMM-Intermag Conference, 1998. Abstracts., The 7th Joint

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-7803-5118-5

Type

DOI

10.1109/INTMAG.1998.742627

Filename

742627

Link To Document