• DocumentCode
    251574
  • Title

    Self-testing checker design for incomplete m-out-of-n codes

  • Author

    Butorina, N.

  • Author_Institution
    Tomsk State Univ., Tomsk, Russia
  • fYear
    2014
  • fDate
    26-29 Sept. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents the synthesis of self-testing checker (STC) for a subset of l codewords of m-out-of-n code. We consider FPGA realization of the checker.
  • Keywords
    codes; field programmable gate arrays; logic design; logic testing; FPGA realization; STC; codewords; incomplete m-out-of-n codes; self-testing checker design; Built-in self-test; Circuit faults; Computers; Educational institutions; Field programmable gate arrays; Single event upsets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium (EWDTS), 2014 East-West
  • Conference_Location
    Kiev
  • Type

    conf

  • DOI
    10.1109/EWDTS.2014.7027072
  • Filename
    7027072
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=251574