DocumentCode
2516036
Title
Evaluation of space charge properties in polymers by using a scanning electron microscope
Author
Marsacq, D. ; Hourquebie, Patrick ; Janah, Hakim
Author_Institution
CEA, Centre d´´Etudes du Ripault, Monts, France
fYear
1998
fDate
22-25 Jun 1998
Firstpage
28
Lastpage
31
Abstract
In order to try to improve dielectric properties of polymers, we have explored the space charge characteristics by using a scanning electron microscope (SEM). By controlling the conditions of charge injection close to the surface of the sample, it has been possible to evaluate on one hand the trapping ability of the material and on the other hand the corresponding detrapping potential. This latter parameter was connected to the space charge spreading during injection as seen by a decrease of the detrapping potential with increasing the size of the domain where the charges are injected. This size can be monitored by a careful control of the focalisation of the electron beam on the surface of the sample. Using this technic a same amount of charges can be injected into domains with different size. Moreover, the surface potential was found to be dependent on the structural parameters of the tested polymers such as branching ratio. To better characterize the space charge properties, the detrapping potential has been examined at different temperatures. These experiences have indicated that above a critical value a decrease of the sample temperature strongly affects the space charge spreading. Characterization of the evolution of the dielectric losses (tanδ) with the temperature showed that this critical temperature was close to the glass transition temperature of the sample. These results have suggested that the macromolecules motion plays a significant role in the space charge spreading
Keywords
charge injection; dielectric losses; polymers; scanning electron microscopy; space charge; surface potential; branching ratio; charge injection; critical temperature; detrapping potential; dielectric loss; dielectric properties; glass transition temperature; polymer; scanning electron microscopy; space charge; structural parameters; surface potential; Dielectric losses; Dielectric materials; Electron traps; Monitoring; Polymers; Scanning electron microscopy; Size control; Space charge; Space exploration; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
Conference_Location
Vasteras
Print_ISBN
0-7803-4237-2
Type
conf
DOI
10.1109/ICSD.1998.709219
Filename
709219
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