• DocumentCode
    2516036
  • Title

    Evaluation of space charge properties in polymers by using a scanning electron microscope

  • Author

    Marsacq, D. ; Hourquebie, Patrick ; Janah, Hakim

  • Author_Institution
    CEA, Centre d´´Etudes du Ripault, Monts, France
  • fYear
    1998
  • fDate
    22-25 Jun 1998
  • Firstpage
    28
  • Lastpage
    31
  • Abstract
    In order to try to improve dielectric properties of polymers, we have explored the space charge characteristics by using a scanning electron microscope (SEM). By controlling the conditions of charge injection close to the surface of the sample, it has been possible to evaluate on one hand the trapping ability of the material and on the other hand the corresponding detrapping potential. This latter parameter was connected to the space charge spreading during injection as seen by a decrease of the detrapping potential with increasing the size of the domain where the charges are injected. This size can be monitored by a careful control of the focalisation of the electron beam on the surface of the sample. Using this technic a same amount of charges can be injected into domains with different size. Moreover, the surface potential was found to be dependent on the structural parameters of the tested polymers such as branching ratio. To better characterize the space charge properties, the detrapping potential has been examined at different temperatures. These experiences have indicated that above a critical value a decrease of the sample temperature strongly affects the space charge spreading. Characterization of the evolution of the dielectric losses (tanδ) with the temperature showed that this critical temperature was close to the glass transition temperature of the sample. These results have suggested that the macromolecules motion plays a significant role in the space charge spreading
  • Keywords
    charge injection; dielectric losses; polymers; scanning electron microscopy; space charge; surface potential; branching ratio; charge injection; critical temperature; detrapping potential; dielectric loss; dielectric properties; glass transition temperature; polymer; scanning electron microscopy; space charge; structural parameters; surface potential; Dielectric losses; Dielectric materials; Electron traps; Monitoring; Polymers; Scanning electron microscopy; Size control; Space charge; Space exploration; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
  • Conference_Location
    Vasteras
  • Print_ISBN
    0-7803-4237-2
  • Type

    conf

  • DOI
    10.1109/ICSD.1998.709219
  • Filename
    709219