• DocumentCode
    2516904
  • Title

    Error recovery of variable length codes over BSC with arbitrary crossover probability

  • Author

    Zhou, Jiantao ; Au, Oscar C. ; Fan, Xiaopeng ; Wong, Peter Hon-Wah

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong
  • fYear
    2008
  • fDate
    6-11 July 2008
  • Firstpage
    1188
  • Lastpage
    1192
  • Abstract
    The error recovery capability of variable length code (VLC) has been considered as an important performance and design criterion in addition to its coding efficiency. However, almost all of the existing methods for evaluating the error recovery capability of VLC assume that the transmission fault is a random single bit inversion. In this paper, we consider a more generalized problem of precisely evaluating the error recovery capability of VLC in the case that the encoded bit stream is transmitted over a BSC with arbitrary crossover probability. By making use of the Perron-Frobenius Theorem, we derive a very simple expression for the exact mean symbol error rate (MSER) in Levenshtein distance sense. We also prove that in the very low crossover probability region, the mean error propagation length (MEPL) derived for single inversion error case approaches a scaled value of MSER. In addition, we briefly discuss the error recovery of VLC over Gilbert-Elliott channel, which is one of the simplest and practical models for a channel with memory.
  • Keywords
    probability; system recovery; variable length codes; BSC; Gilbert-Elliott channel; Levenshtein distance sense; Perron-Frobenius Theorem; arbitrary crossover probability; error recovery; mean error propagation length; mean symbol error rate; variable length codes; Bit error rate; Computer errors; Couplings; Decoding; Design engineering; Error analysis; Gold; Noise robustness; Probability; Source coding; BSC; Source coding; VLC; error recovery;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2008. ISIT 2008. IEEE International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-2256-2
  • Electronic_ISBN
    978-1-4244-2257-9
  • Type

    conf

  • DOI
    10.1109/ISIT.2008.4595175
  • Filename
    4595175